El Instituto Politécnico Nacional
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http://repositoriodigital.ipn.mx/handle/123456789/10961| Título : | Study of the effect of DMSO concentration on the thickness of the PSS insulating barrier in PEDOT:PSS thin films |
| Palabras clave : | PEDOT DMSO IMPEDANCE SPECTROSCOPY |
| Fecha de publicación : | 16-ene-2013 |
| Editorial : | ELSEVIER |
| Descripción : | One of the most used secondary dopants in thin film processing of PEDOT:PSS is dimethyl sulfoxide
(DMSO). In this work, we present results that explain, from the point of view of impedance spectroscopy,
the mechanism of the increase in the conductivity observed on films based on PEDOT:PSS. The results
obtained with this technique, combined with others such as AFM, and Raman and UV–vis–NIR spectroscopies,
clearly show that there is a thinning of the insulating barrier of PSS surrounding conductive grains
of PEDOT. It is shown that the thickness of the insulating barrier is related strongly and inversely with
the onset frequency of AC conductivity. However, this is not the only existing effect, because for values
beyond the optimal concentration of DMSO, we observe a decrease in the conductivity related with an
increase of the separation of the PEDOT grains. The AC measurements and the AFM images also show the
clear interplay between the increase of the PEDOT average grain size and the separation between them. Investigación INSTITUTO POLITECNICO NACIONAL |
| URI : | http://www.repositoriodigital.ipn.mx/handle/123456789/10961 |
| Otros identificadores : | Synthetic Metals 160 (2010) 1501-1506 0379-6779 http://hdl.handle.net/123456789/479 |
| Aparece en las colecciones: | Doctorado |
Ficheros en este ítem:
| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| 2010-1 1.pdf | 85.87 kB | Adobe PDF | Visualizar/Abrir |
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