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dc.contributor.authorGonzález Trujillo, M. A.-
dc.contributor.authorAlbor Aguilera, M.L.-
dc.contributor.authorRodríguez Morán, D.A.-
dc.contributor.authorMatsumoto Kuwabara, Y.-
dc.contributor.authorGalván Arellano, M.-
dc.contributor.authorCasados Cruz, G.-
dc.contributor.authorMorales Acevedo, A.-
dc.date.accessioned2012-11-19T18:48:14Z-
dc.date.available2012-11-19T18:48:14Z-
dc.date.issued2012-11-19-
dc.identifier.urihttp://www.repositoriodigital.ipn.mx/handle/123456789/8255-
dc.descriptionZinc Telluride (ZnTe) thin films were deposited onto glass and CdTe substrates by CSVT (Close Space Vapor Transport) technique. The analysis of the chemical compositions for the as-deposited as well as annealed ZnTe thin films was estimated by using the method of energy dispersive analysis of x-ray (EDAX). The morphological structural, optical and electrical properties were studied.es
dc.description.abstractZinc Telluride (ZnTe) thin films were deposited onto glass and CdTe substrates by CSVT (Close Space Vapor Transport) technique. The analysis of the chemical compositions for the as-deposited as well as annealed ZnTe thin films was estimated by using the method of energy dispersive analysis of x-ray (EDAX). The morphological structural, optical and electrical properties were studied.es
dc.language.isoeses
dc.subjectOPTICAL AND ELECTRICAL PROPERTIES OF ZnTe AND ZnTe:O THIN FILMS DEPOSITED BY CSVT TECHNIQUEes
dc.titleOPTICAL AND ELECTRICAL PROPERTIES OF ZnTe AND ZnTe: O THIN FILMS DEPOSITED BY CSVT TECHNIQUEes
dc.typeponenciaes
dc.description.especialidadCiencias, Fisica, Quimica, Computaciones
dc.description.tipoPDFes
dc.description.tipoPPTXes
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